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Fringe Pattern Analysis for Optical Metrology: Theory; Algorithms; and Applications

$14.99

Download Fringe Pattern Analysis for Optical Metrology: Theory; Algorithms; and Applications by in pdf format. This book is under the category Physics. You may refer the table below for additional details of the book.

SKU: 559e24aaebb0 Category:

Additional information

Author(s)

Manuel Servin; J. Antonio Quiroga; Moises Padilla

Year

Jul-14

Publisher

John Wiley & Sons; Inc

Pages

345

Category

Physics

File Type

pdf

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